Publications of Ernst Fill

Yang, Y. Y.; Süssmann, F.; Zherebtsov, S.; Pupeza, I.; Kaster, J.; Lehr, D.; Fuchs, H. J.; Kley, E. B.; Fill, E.; Duan, X. M. et al.; Zhao, Z. S.; Krausz, F.; Stebbings, S. L.; Kling, M. F.: Optimization and characterization of a highly-efficient diffraction nanograting for MHz XUV pulses. Optics Express 19 (3), pp. 1954 - 1962 (2011)

Yang, Y.-Y.; Süßmann, F.; Zherebtsov, S.; Pupeza, I.; Kaster, J.; Lehr, D.; Fuchs, H. J.; Kley, E. B.; Fill, E.; Duan, X. M. et al.; Zhao, Z. S.; Krausz, F.; Stebbings, S. L.; Kling, M. F.: Optimization and characterization of a highly-efficient diffraction nanograting for MHz XUV pulses. Optics Express 19 (3), pp. 1954 - 1962 (2011)

Pupeza, I.; Gu, X.; Fill, E.; Eidam, T.; Limpert, J.; Tünnermann, A.; Krausz, F.; Udem, T.: Highly sensitive dispersion measurement of a high-power passive optical resonator using spatial-spectral interferometry. Optics Express 18 (25), 26184 (2010)

Centurion, M.; Reckenthaeler, P.; Krausz, F.; Fill, E.: Picosecond electron diffraction from molecules aligned by dissociation. Journal of Molecular Structure 978 (1-3 Sp. Iss. Sp. Iss. SI), pp. 141 - 146 (2010)

Pupeza, I.; Eidam, T.; Rauschenberger, J.; Bernhardt, B.; Ozawa, A.; Fill, E.; Apolonskiy, A.; Udem, T.; Limpert, J.; Alahmed, Z. A. et al.; Azzeer, A. M.; Tünnermann, A.; Hänsch, T. W.; Krausz, F.: Power scaling of a high-repetition-rate enhancement cavity. Optics Letters 35 (12), pp. 2052 - 2054 (2010)

Wytrykus, D.; Centurion, M.; Reckenthaeler, P.; Krausz, F.; Apolonskiy, A.; Fill, E. E.: Ultrashort pulse electron gun with a MHz repetition rate. Applied Physics B - Lasers and Optics 96 (2-3), pp. 309 - 314 (2009)

Reckenthaeler, P.; Centurion, M.; Fuß, W.; Trushin, S. A.; Krausz, F.; Fill, E. E.: Time-Resolved Electron Diffraction from Selectively Aligned Molecules. Physical Review Letters 102 (21), 213001 (2009)

Centurion, M.; Reckenthaeler, P.; Krausz, F.; Fill, E. E.: Picosecond imaging of low-density plasmas by electron deflectometry. Optics Letters 34 (4), pp. 539 - 541 (2009)

Fill, E. E.; Krausz, F.; Raizen, M. G.: Single-molecule electron diffraction imaging with charge replacement. New Journal of Physics 10, 093015 (2008)

Centurion, M.; Reckenthaeler, P.; Trushin, S. A.; Krausz, F.; Fill, E. E.: Picosecond electron deflectometry of optical-field ionized plasmas. Nature Photonics 2 (5), pp. 315 - 318 (2008)

Reckenthaeler, P.; Centurion, M.; Yakovlev, V. S.; Lezius, M.; Krausz, F.; Fill, E. E.: Proposed method for measuring the duration of electron pulses by attosecond streaking. Physical Review A 77 (4), 042902 (2008)

Veisz, L.; Kurkin, G.; Chernov, K.; Tarnetsky, V.; Apolonskiy, A.; Krausz, F.; Fill, E.: Hybrid dc–ac electron gun for fs-electron pulse generation. New Journal of Physics 9, 451 (2007)

Fill, E.; Veisz, L.; Apolonski, A.; Krausz, F.: Sub-fs electron pulses for ultrafast electron diffraction. New Journal of Physics 8, 272 (2006)

Tommasini, R.; Bruch, R.; Fill, E.; Bjeoumikhov, A.: Convergent-beam diffraction of ultra-short hard X-ray pulses focused by a capillary lens. Applied Physics B 82 (4), pp. 519 - 522 (2006)

Fill, E. E.; Trushin, S.; Bruch, R.; Tommasini, R.: Diffraction of laser-plasma-generated electron pulses. Applied Physics B 81 (2-3), pp. 155 - 157 (2005)

Fill, E. E.: Ultrashort-pulse laser plasmas: Fraction of hot electrons escaping from the target and electron spectra in planar and spherical geometry. Physics of Plasmas 12 (5), 052704 (2005)

Tommasini, R.; Fill, E. E.: Generation of attosecond X-ray laser pulses. IEEE Journal of Selected Topics in Quantum Electronics 10 (6), pp. 1388 - 1392 (2004)

Tommasini, R.; Fill, E. E.; Bruch, R.; Pretzler, G.: Generation of monoenergetic ultrashort electron pulses from a fs laser plasma. Applied Physics B-Lasers and Optics 79 (8), pp. 923 - 926 (2004)

Fill, E. E.: Kinetics of ultrashort relativistic electron pulses emitted from solid targets. Physical Review E 70 (3), 036409 (2004)

Lan, K.; Fill, E.; Meyer-ter-Vehn, J.: Photopumping of XUV lasers by XFEL radiation. Laser and Particle Beams 22 (3), pp. 261 - 266 (2004)